Patent AT-E400011-T1: [Translated] MEASURING PROBE FOR A MACHINE TOOL CONFIGURABLE BY BENDING THE PROBE

A probe 10 has internal circuitry capable of operating in a plurality of different modes, for example a variety of filter modes and turn off modes. A method of operating such a probe is described in which deflection of the stylus is used to set the mode of operation. In one embodiment, the probe has a workpiece-contacting stylus 11 mounted on a seat from which it is deflectable.